The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jun. 05, 2015
Mitutoyo Corporation, Kanagawa, JP;
Hideyuki Nakagawa, Ibaraki, JP;
Nobuhiro Ishikawa, Ibaraki, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
In a shape measuring apparatus having a scanning probe to perform scanning measurement using a tip ball provided at an end of a stylus with the tip ball being in contact with an object to be measured, a tip ball displacement detector detects a displacement of the tip ball of the scanning probe, a displacement of a moving mechanism that relatively moves the object to be measured and the scanning probe is detected, and an angle formed by a contact direction of the tip ball with the object to be measured and an axial direction of the stylus is calculated. The displacement of the tip ball that is detected by the tip ball displacement detector is corrected on the basis of the angle, and a corrected value of the displacement is outputted. The corrected value is added to the displacement of the moving mechanism to calculate a measurement value.