The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jul. 07, 2015
Particle Measuring Systems, Inc., Boulder, CO (US);
Particle Measuring Systems, S.r.l., Fonte Nuova (Rome), IT;
Gerald Gromala, Broomfield, CO (US);
Ronald W. Adkins, Monkton, MD (US);
Gilberto Dalmaso, Fonte Nuova, IT;
Brian A. Knollenberg, Windsor, CO (US);
Daniel Rodier, Louisville, CO (US);
PARTICLE MEASURING SYSTEMS, INC., Boulder, CO (US);
PARTICLE MEASURING SYSTEMS, S.R.L., Rome, IT;
Abstract
This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.