The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Aug. 29, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Andrew Marshall, Dallas, TX (US);

Ping Jiang, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 27/26 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/028 (2013.01); G01R 31/003 (2013.01); G01R 27/2605 (2013.01);
Abstract

A method of evaluating at least one parameter of a first capacitor. The method couples a number of capacitors in a capacitor network to a common node, the number of capacitors comprising at least three capacitors. Further, the method first applies a first voltage range to the capacitor network for causing a first voltage drop across the first capacitor, and it evaluates the at least one parameter in response to the first voltage range. The method second applies a second voltage range to the capacitor network for causing a second voltage drop across the first capacitor, the second voltage drop greater than the first voltage drop, and it evaluates the at least one parameter in response to the second voltage range.


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