The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Aug. 29, 2014
Applicant:

Mentor Graphics Corporation, Wilsonville, OR (US);

Inventors:

Rajeev Sehgal, Noida, IN;

Srinivas Mandavilli, Hyderabad, IN;

Pradish Mathews, Noida, IN;

Ajit Singh, Delhi, IN;

Henry Potts, Ft. Collins, CO (US);

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/0175 (2006.01); H03K 9/08 (2006.01); H03K 3/02 (2006.01); H03K 19/096 (2006.01); H03K 3/013 (2006.01); G01R 19/165 (2006.01); G06F 11/14 (2006.01); H03K 3/037 (2006.01);
U.S. Cl.
CPC ...
H03K 19/017509 (2013.01); G01R 19/16504 (2013.01); G06F 11/14 (2013.01); H03K 3/013 (2013.01); H03K 3/0375 (2013.01); H03K 19/096 (2013.01);
Abstract

This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.


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