The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2017

Filed:

Oct. 12, 2015
Applicant:

Alpha and Omega Semiconductor Incorporated, Sunnyvale, CA (US);

Inventors:

Daniel Calafut, San Jose, CA (US);

Madhur Bobde, Santa Clara, CA (US);

Yeeheng Lee, San Jose, CA (US);

Hong Chang, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/423 (2006.01); H01L 29/49 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/872 (2006.01);
U.S. Cl.
CPC ...
H01L 29/42368 (2013.01); H01L 29/4236 (2013.01); H01L 29/4916 (2013.01); H01L 29/66666 (2013.01); H01L 29/7813 (2013.01); H01L 29/7827 (2013.01); H01L 29/8725 (2013.01);
Abstract

A power MOSFET device including a semiconductor layer, an active trench formed in the semiconductor layer and housing a dual oxide thickness trench gate structure where a bottom of the trench gate is isolated from a bottom of the active trench by a liner oxide layer having a first thickness, and a termination trench formed in the semiconductor layer apart from the active trench and housing a dual oxide thickness trench gate structure where a bottom of the trench gate is isolated from a bottom of the termination trench by the liner oxide layer having a second thickness. In one embodiment, the second thickness is greater than the first thickness. In another embodiment, the trench gate in each of the active trench and the termination trench is formed as a single polysilicon layer.


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