The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Sep. 21, 2015
Applicant:
Freescale Semiconductor Inc., Austin, TX (US);
Inventors:
Alistair Paul Robertson, Glasgow, GB;
Andrew Edward Birnie, Bearsden, GB;
Alison Young, Clarkston, GB;
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0739 (2013.01); G06F 11/0751 (2013.01);
Abstract
An error response method for a mixed criticality system includes assigning a safety level to an application executed by a processor. Executing the application includes a transaction between the processor and a resource. The safety level is stored at the resource. The safety level and a fault indication are transmitted from the resource to a fault collection and control unit (FCCU). The fault indication is responsive to a fault from the resource. The FCCU responds to the fault indication with an action determined by the safety level.