The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2017
Filed:
Jul. 09, 2015
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6408 (2013.01); G01N 21/6458 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G01N 2201/067 (2013.01); G01N 2201/0675 (2013.01); G01N 2201/06113 (2013.01);
Abstract
Method for the operation of a laser scanning microscope. The microscope includes an illumination beam path in which at least one illumination light source is arranged, a detection beam path in which at least one photomultiplier (PMT) is incorporated as detector, and a control unit for controlling fluorescence experiments. A sample is alternately illuminated at high intensity via the control unit, and the fluorescence decay behavior of sample points and/or sample regions is subsequently detected. The PMT is switched on and off depending on the illumination mode by the control unit via a switch directly in the high-voltage supply of the PMT.