The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Jun. 21, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Robert E. Jeter, Santa Clara, CA (US);

Kai Lun Hsiung, Fremont, CA (US);

Rakesh L. Notani, Sunnyvale, CA (US);

Xingchao C. Yuan, Palo Alto, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 11/4076 (2006.01); G11C 11/4093 (2006.01); G11C 11/4096 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4076 (2013.01); G11C 11/4093 (2013.01); G11C 11/4096 (2013.01);
Abstract

A method and apparatus for memory calibration averaging is disclosed. In one embodiment, a memory subsystem includes a memory and a memory controller. The memory controller includes a calibration control circuit that periodically performs calibrations of the memory subsystem. Calibration may be performed for a delay applied to a data strobe used to synchronized transfers of data between the memory controller and the memory, and a reference voltage used to distinguish between a logic 0 and a logic 1 during memory reads. Following the performance of a calibration, the values of the delay and the reference voltage may be set based on an average of a most recent number of calibrations.


Find Patent Forward Citations

Loading…