The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Apr. 24, 2015
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Tetsuya Arai, Tokyo, JP;
Junki Taniguchi, Tokyo, JP;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/0185 (2006.01); G11C 11/04 (2006.01); G11C 7/04 (2006.01); G11C 11/4093 (2006.01); G11C 5/02 (2006.01); G11C 29/02 (2006.01); G11C 11/401 (2006.01);
U.S. Cl.
CPC ...
G11C 7/04 (2013.01); G11C 5/025 (2013.01); G11C 11/4093 (2013.01); G11C 29/021 (2013.01); G11C 29/025 (2013.01); G11C 29/028 (2013.01); H03K 19/018507 (2013.01); H03K 19/018585 (2013.01); G11C 11/401 (2013.01); G11C 2207/105 (2013.01); G11C 2207/2254 (2013.01);
Abstract
An apparatus includes a first channel, a second channel and a calibration circuit. The first channel includes a first command control circuit. The second channel includes a second command control circuit independent of the first command control circuit. The calibration circuit is shared by the first channel and the second channel to generate a calibration code responsive to a calibration command generated responsive to a first calibration command from the first command control circuit and a second calibration command from the second command control circuit.