The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Sep. 03, 2012
Takeshi Yogi, Tokyo, JP;
Sakuichiro Adachi, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Hajime Yamazaki, Tokyo, JP;
Takeshi Yogi, Tokyo, JP;
Sakuichiro Adachi, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Hajime Yamazaki, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An analyzer provides conditions suitable for a reagent for performing latex immunoassay with a high sensitivity using a method of measuring scattered light. Irradiation light having a wavelength in the range of 0.65 to 0.75 μm is used, and scattered light generated from a reaction solution is received at a light-receiving angle of 15° to 35° with respect to the irradiation direction during the rotational movement of the reaction container. The reagent contains latex particles the average peak particle diameter of which ranges from 0.3 μm to 0.43 μm and to which antibodies are sensitized. The reaction solution contains latex particles at a concentration at which the absorbance to irradiation light having a wavelength of 0.7 μm is 0.25 abs to 1.10 abs, and a change in the amount of scattered light caused by the aggregation of the latex particles through antigens in a sample is measured and quantified.