The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Jul. 10, 2012
Applicants:

Yosi Cherbis, Haifa, IL;

Noam Rozenshtein, Afula, IL;

Tomer Segev, Shimshit, IL;

Avi Levy, Mitzpe Aviv, IL;

Inventors:

Yosi Cherbis, Haifa, IL;

Noam Rozenshtein, Afula, IL;

Tomer Segev, Shimshit, IL;

Avi Levy, Mitzpe Aviv, IL;

Assignee:

CAMTEK LTD., Migdal Haemeq, IL;

Attorney:
Int. Cl.
CPC ...
H05K 3/22 (2006.01); H05K 3/12 (2006.01); H05K 3/34 (2006.01); H05K 13/08 (2006.01);
U.S. Cl.
CPC ...
H05K 3/22 (2013.01); H05K 3/1233 (2013.01); H05K 3/225 (2013.01); H05K 3/3484 (2013.01); H05K 13/08 (2013.01); H05K 2203/163 (2013.01);
Abstract

A system and a method for inspection aided printing, the method may include printing, by a printing unit of a system, a pattern on an area of a substrate, during a printing process; inspecting, by an inspection unit of the system, the area to provide inspection results; searching, by a processor of the system, for a defect, based upon the inspection results; and wherein if a defect is found—determining whether to (a) repair the substrate, (b) perform a corrective measure for improving the printing process, or (c) perform no corrective measure in response to the defect.


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