The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Jul. 25, 2014
Applicants:
Trent S. Uehling, New Braunfels, TX (US);
Ilko Schmadlak, Feldkirchen, DE;
Inventors:
Trent S. Uehling, New Braunfels, TX (US);
Ilko Schmadlak, Feldkirchen, DE;
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H01L 21/66 (2006.01); G01R 31/00 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); G01R 31/003 (2013.01); G01R 31/02 (2013.01); H01L 22/34 (2013.01);
Abstract
A method for manufacturing a semiconductor device is disclosed. The method includes generating a thermo-mechanical stress within a plurality of layers of a wafer, and after generating the thermo-mechanical stress, testing an interfacial strength level associated with one or more of the plurality of layers.