The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Dec. 30, 2013
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Chi-Wei Chang, Baoshan Township, Hsinchu County, TW;

Woo-Guan Chiong, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G01S 5/10 (2006.01); H01L 21/68 (2006.01); H01L 21/67 (2006.01); H01L 21/677 (2006.01);
U.S. Cl.
CPC ...
G01S 5/10 (2013.01); H01L 21/67126 (2013.01); H01L 21/67259 (2013.01); H01L 21/67742 (2013.01); H01L 21/68 (2013.01);
Abstract

In accordance with some embodiments, a positioning calibration device arranged within a transfer buffer is provided. The positioning calibration device includes at least one target element and at least three positioning modules. The at least one target element is arranged on a wafer transportation apparatus within the transfer buffer. The transportation apparatus is utilized to transfer a wafer. The at least three positioning modules are utilized to detect the positions of the at least one target element by wireless communications for generating position information of the wafer transportation apparatus. The heights which each of the at least three positioning modules arranged at are not the same.


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