The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jun. 18, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Guillem Sole, Barcelona, ES;

Roger Espasa, Barcelona, ES;

Sorin Iacobovici, San Jose, CA (US);

Brian Hickmann, Sherwood, OR (US);

Wei Wu, Portland, OR (US);

Thomas Fletcher, Sherwood, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); H03M 13/09 (2006.01); H03M 13/17 (2006.01); H03M 13/19 (2006.01); H03M 13/29 (2006.01);
U.S. Cl.
CPC ...
H03M 13/09 (2013.01); H03M 13/17 (2013.01); H03M 13/19 (2013.01); H03M 13/29 (2013.01);
Abstract

Embodiments of an invention for consecutive bit error detection and correction are disclosed. In one embodiment, an apparatus includes a storage structure, a second storage structure, a parity checker, an error correction code (ECC) checker, and an error corrector. The first storage structure is to store a plurality of data values, a plurality of parity values, and a plurality of ECC values, each parity value corresponding to one of the plurality of data values, a first bit of each parity value corresponding to a first of a plurality of portions of a corresponding data value, wherein the first of the plurality of portions of the corresponding data value is interleaved with a second of the plurality of portions of the corresponding data value, wherein a second bit of each parity value corresponds to a second of the plurality of portions of the corresponding data value, each ECC value corresponding to one of the plurality of data values. The parity checker is to detect a parity error in a data value stored in the first storage structure using a parity value corresponding to the data value. The ECC checker is to generate a syndrome. The error corrector is to detect and correct consecutive bit errors in the data value using the syndrome.


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