The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Aug. 01, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Johannes Winterot, Jena, DE;
Thomas Milde, Jena, DE;
Max Funck, Weimar, DE;
Toufic Jabbour, Aalen, DE;
Carl Zeiss Microscopy GMBH, Jena, DE;
Abstract
The invention relates to a method for calibrating a digital optical imaging system, comprising at least one motorized or coded zoom system and an image sensor, to a method for correcting aberrations in such an imaging system, and to an optical imaging system which is configured to carry out the methods according to the invention. During the calibration method, a reference object is recorded in various zoom settings and the image is corrected pixel-wise with digital-optical means using a previously determined model. To this end, distortion correction coefficients and image stability correction coefficients are ascertained. The real total magnification of the system is ascertained from the corrected image. The model ascertained in the calibration process also serves for correcting aberrations during operation of the imaging system.