The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jan. 30, 2014
Mitutoyo Corporation, Kanagawa-ken, JP;
Scott Allen Harsila, Bothell, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
Reflective assemblies are provided that may be attached to the end of a chromatic confocal point sensor optical pen. Each reflective assembly includes a reflective surface (e.g., a turning mirror) oriented for directing a measurement beam along a measurement axis at a selected angle relative to the central Z-axis of the optical pen. Reflective assemblies with different orientations for the measurement beams (e.g., 60 degrees, 120 degrees, etc.) allow for measurements of workpiece features that cannot be achieved with a measurement beam directed in a normal incident manner or at a standard 90 degree orientation. In one implementation, the reflective assemblies may be kinematically located and retained using magnetic coupling, and may be rotated and reseated in different rotational orientations about the central Z-axis of the optical pen. A set of such reflective assemblies greatly increases the measurement capability of a single optical pen, in an economical manner.