The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jun. 24, 2014
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Shigetsune Torin, Beaverton, OR (US);

Thomas C. Hill, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 13/02 (2006.01); G01R 29/26 (2006.01); G01R 31/317 (2006.01); G01R 25/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 13/0218 (2013.01); G01R 25/00 (2013.01); G01R 29/26 (2013.01); G01R 31/28 (2013.01); G01R 31/31709 (2013.01);
Abstract

Embodiments of the invention include a test and measurement instrument including a test signal input and a sampler coupled to the test signal input to generate a sampled test signal. The instrument also includes a noise reduction system that includes an additional oscillator coupled to the sampler and structured to generate a sampled oscillating signal, as well as a phase detector coupled to the sampled oscillating signal for measuring noise introduced by the sampler. The noise reduction system further includes a phase corrector coupled to the phase detector for removing the measured amount of noise from the sampled test signal. Methods of noise detection are also described.


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