The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Jan. 28, 2014
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Donald M Lee, Sunnyvale, CA (US);

Heidi Barnes, Forestville, CA (US);

Kosuke Miyao, Sunnyvale, CA (US);

Bela Szendrenyi, Santa Rosa, CA (US);

Vanessa Bischler, Boeblinger, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03H 7/40 (2006.01);
U.S. Cl.
CPC ...
H03H 7/40 (2013.01); G01R 31/2822 (2013.01);
Abstract

A preferred method for efficiently tuning RF ports while avoiding conventional labor intensive, step-by-step processes is disclosed. The method may use at least three tuning blocks (comprised of capacitors and inductors) in a series topology and at least three tuning blocks in a shunt topology. These tuning blocks will yield two circles that can be charted on the Smith chart. Those circles may then be centered along the centerline of the Smith chart to adjust for latency, and then expanded to adjust for the losses. Once those circles have been expanded, the circle (either series or shunt) that encompasses one the Smith chart reference circles is used and the traditional Smith chart methodology can be used to tune the RF port.


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