The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Aug. 25, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Peng Cheng, Greensboro, NC (US);

James S. Dunn, Jericho, VT (US);

Blaine J. Gross, Essex Junction, VT (US);

Qizhi Liu, Lexington, MA (US);

James A. Slinkman, Montpelier, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/70 (2006.01); H01L 27/12 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 27/02 (2006.01); H01L 29/06 (2006.01); H01L 29/165 (2006.01); H01L 29/45 (2006.01); H01L 21/308 (2006.01); H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1203 (2013.01); H01L 21/3081 (2013.01); H01L 27/0207 (2013.01); H01L 27/1207 (2013.01); H01L 29/0649 (2013.01); H01L 29/165 (2013.01); H01L 29/456 (2013.01); H01L 29/66477 (2013.01); H01L 29/78 (2013.01); H01L 29/7842 (2013.01); H01L 27/088 (2013.01);
Abstract

Various embodiments include field effect transistors (FETs) and related integrated circuit (IC) layouts. One FET includes: a silicon substrate including a set of trenches; a first oxide abutting the silicon substrate; a silicon germanium (SiGe) layer overlying the silicon substrate; a silicon layer overlying the SiGe layer; a second oxide overlying the silicon layer, wherein the silicon layer includes a plurality of salicide regions; a gate structure overlying the second oxide between adjacent salicide regions; and a first contact contacting the gate structure; a second contact contacting one of the salicide regions; a third oxide partially filling the set of trenches and extending above the silicon layer overlying the SiGe layer; and an air gap in each of the set of trenches, the air gap surrounded by the third oxide.


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