The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Aug. 12, 2016
International Business Machines Corporation, Armonk, NY (US);
Eric A. Foreman, Fairfax, VT (US);
Jeffrey G. Hemmett, St. George, VT (US);
Kerim Kalafala, Rhinebeck, NY (US);
Gregory M. Schaeffer, Poughkeepsie, NY (US);
Stephen G. Shuma, Underhill, VT (US);
Alexander J. Suess, Hopewell Junction, VT (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Michael H. Wood, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems and methods compute a mean timing value of an integrated circuit design for variables using a first timing calculation of relatively higher accuracy; and calculate a first timing value of the integrated circuit design for the variables, using a second timing calculation having a relatively lower accuracy. Such systems and methods calculate second timing values of the integrated circuit design for additional sets of variables using the second timing calculation; and calculate finite differences of each of the second timing values to the first timing value. Thus, these systems and methods calculate a statistical sensitivity of the first timing value to the additional sets of variables based on the finite differences. Further, such systems and methods calculate a statistical sensitivity of the mean timing value to the additional sets of values based on the statistical sensitivity of the first timing value to the additional sets of values.