The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Aug. 25, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael F. Fee, Cold Spring, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

Arthur J. O'Neill, Jr., Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/10 (2006.01); G06F 11/20 (2006.01); G11C 29/00 (2006.01); G06F 3/06 (2006.01); G11C 29/42 (2006.01); G11C 29/52 (2006.01); G11C 29/56 (2006.01); G06F 12/0811 (2016.01); G06F 12/084 (2016.01); G06F 12/0842 (2016.01); H03M 13/19 (2006.01); G11C 29/24 (2006.01); G11C 15/00 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01); G06F 3/0679 (2013.01); G06F 11/07 (2013.01); G06F 11/073 (2013.01); G06F 11/076 (2013.01); G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0763 (2013.01); G06F 11/0772 (2013.01); G06F 11/0793 (2013.01); G06F 11/106 (2013.01); G06F 11/1008 (2013.01); G06F 11/1024 (2013.01); G06F 11/1028 (2013.01); G06F 11/1048 (2013.01); G06F 11/1064 (2013.01); G06F 11/20 (2013.01); G06F 12/084 (2013.01); G06F 12/0811 (2013.01); G06F 12/0842 (2013.01); G11C 29/00 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); G11C 29/56008 (2013.01); H03M 13/19 (2013.01); G06F 2201/805 (2013.01); G06F 2201/82 (2013.01); G06F 2201/85 (2013.01); G06F 2212/1032 (2013.01); G11C 15/00 (2013.01); G11C 29/24 (2013.01); G11C 29/76 (2013.01); G11C 2029/0411 (2013.01);
Abstract

A technique is provided for accumulating failures. A failure of a first row is detected in a group of array macros, the first row having first row address values. A mask has mask bits corresponding to each of the first row address values. The mask bits are initially in active status. A failure of a second row, having second row address values, is detected. When none of the first row address values matches the second row address values, and when mask bits are all in the active status, the array macros are determined to be bad. When at least one of the first row address values matches the second row address values, mask bits that correspond to at least one of the first row address values that match are kept in active status, and mask bits that correspond to non-matching first address values are set to inactive status.


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