The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2017

Filed:

Oct. 23, 2012
Applicant:

Keithley Instruments, Inc., Cleveland, OH (US);

Inventor:

James A. Niemann, Chagrin Falls, OH (US);

Assignee:

Keithley Instruments, LLC, Solon, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 17/02 (2006.01); G01R 31/28 (2006.01); G01R 1/20 (2006.01); G01R 15/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2839 (2013.01); G01R 1/203 (2013.01); G01R 15/12 (2013.01);
Abstract

An impedance sourcing circuit for a measurement device configured to measure a device under test (DUT) and method are disclosed. The impedance sourcing circuit includes a voltage/current source. An electrically controlled variable resistance having a control input is configured to adjust the variable resistance is coupled to the DUT. A loop gain controller is coupled to the control input of the electrically controlled variable resistance. The loop gain controller is configured to drive the control input of the electrically controlled variable resistance to adjust the variable resistance to generally match the impedance of the DUT. The impedance sourcing circuit may also include a voltage detector configured to detect a voltage across the DUT and a voltage reference. The loop gain controller may be configured to drive the control input of the electrically controlled variable resistance based on the voltage detected across the DUT and the voltage reference.


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