The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
May. 09, 2012
Sakuichiro Adachi, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Hajime Yamazaki, Tokyo, JP;
Masaki Shiba, Tokyo, JP;
Sakuichiro Adachi, Tokyo, JP;
Tomonori Mimura, Tokyo, JP;
Hajime Yamazaki, Tokyo, JP;
Masaki Shiba, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The automatic analysis device measures time sequential data on a scattered light amount as reaction process data, and quantitatively determines the concentration of an analyte from a change in light amount. The automatic analysis device has a function of selecting reaction process data to be used for quantitative determination from the reaction process data obtained by measurement using a plurality of light receivers at different angles. As a result of using this function, data is selected from the reaction process data obtained by measurement using the plurality of light receivers at different angles in accordance with the concentration of the analyte and whether the priority is given to high sensitivity in the case where sensitivity is prioritized or a dynamic range, and the result of the quantitative determination is displayed.