The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Apr. 06, 2012
Masaya Ogura, Tokyo, JP;
Masaya Ogura, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
Conventional laboratory tests require calibration before each test. This results in the need for a reagent for calibration before each test. Additionally, calibration takes a long time, and the total TAT (Turn Around Time) of a testing system increases. The testing system thus suffers from the difficulty of improving the testing efficiency. This invention, which has been made to solve the problem, provides a testing element for performing a laboratory test, wherein the testing element includes an information recording section at the surface of and/or inside the testing element, and the information recording section stores information on a characteristic of the testing element.