The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2017

Filed:

Nov. 02, 2015
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Puneet Arora, Noida, IN;

Navneet Kaushik, Delhi, IN;

Steven Lee Gregor, Owego, NY (US);

Norman Card, Vestal, NY (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G11C 29/38 (2006.01); G01R 31/3177 (2006.01); G11C 29/10 (2006.01); G11C 29/12 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G01R 31/3177 (2013.01); G06F 17/5081 (2013.01); G11C 29/10 (2013.01); G11C 29/12 (2013.01);
Abstract

Aspects of the present disclosure involve insertion of power domain aware memory testing logic into integrated circuit designs to enable efficient testing of the memories embedded therein. In example embodiments, each power domain of the integrated circuit, and the memories included therein, are associated with dedicated test data register (TDR) set and instruction set. Each instruction set causes memory test logic circuitry in the integrated circuit to test the memories included in the corresponding power domain in parallel. Once testing of memories within a particular power domain is over, the test circuitry tests memories belonging to another power domain in parallel, and so on.


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