The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Jul. 08, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer which can reduce the effort necessary for conducting a test of limit of detection/limit of quantification properties and managing the test results is provided. Operation condition-setting means for conducting an evaluation test for at least one of a limit of detection and a limit of quantification for each measurement item, determination condition-setting means for setting a determination condition of the evaluation test, and a calculation unit for obtaining a measurement result of a dilution series containing different dilution concentrations by controlling the sample-dispensing mechanism, the reagent-dispensing mechanism and the measurement unit based on the set operation condition, and calculating a test result of the evaluation test from the measurement result of the dilution series based on the set determination condition are disposed.