The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Jan. 27, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Rahul Gulati, Bangalore, IN;
Vasant Easwaran, Bangalore, IN;
Mihir Narendra Mody, Bangalore, IN;
Prashant Dinkar Karandikar, Pune, IN;
Prithvi Y. A. Shankar, Bangalore, IN;
Aishwarya Dubey, Plano, TX (US);
Kedar Chitnis, Bangalore, IN;
Rajat Sagar, Bangalore, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method for testing an imaging subsystem of a system-on-a-chip (SOC) is provided that includes executing imaging subsystem test software instructions periodically on a processor of the SOC, receiving reference image data in the imaging subsystem responsive to the executing of the test software instructions, performing image signal processing on the reference image data by the imaging subsystem to generate processed reference image data, and using the processed reference image data by the test software instructions to verify whether or not the imaging subsystem is operating correctly.