The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jan. 15, 2015
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Yu-Lien Huang, Jhubei, TW;

Ming-Huan Tsai, Zhubei, TW;

Clement Hsingjen Wann, Carmel, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/336 (2006.01); H01L 21/8238 (2006.01); H01L 27/088 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 21/8234 (2006.01); H01L 29/161 (2006.01); H01L 29/167 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7851 (2013.01); H01L 21/823412 (2013.01); H01L 21/823431 (2013.01); H01L 29/105 (2013.01); H01L 29/1054 (2013.01); H01L 29/161 (2013.01); H01L 29/167 (2013.01); H01L 29/66477 (2013.01); H01L 29/66545 (2013.01); H01L 29/66651 (2013.01); H01L 29/66628 (2013.01); H01L 29/66636 (2013.01);
Abstract

A replacement channel and a method for forming the same in a semiconductor device are provided. A channel area is defined in a substrate which is a surface of a semiconductor wafer or a structure such as a fin formed over the wafer. Portions of the channel region are removed and are replaced with a replacement channel material formed by an epitaxial growth/deposition process to include a first dopant concentration level less than a first dopant concentration level. A subsequent doping operation or operations is then used to boost the average dopant concentration to a level greater than the first dopant concentration level. The replacement channel material is formed to include a gradient in which the upper portion of the replacement channel material has a greater dopant concentration than the lower portion of replacement channel material.


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