The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Oct. 14, 2015
Applicant:
Jeol Ltd., Tokyo, JP;
Inventors:
Masaki Morita, Tokyo, JP;
Akira Yasuhara, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
H01J 37/222 (2013.01); H01J 37/28 (2013.01); H01J 2237/221 (2013.01); H01J 2237/2442 (2013.01); H01J 2237/24585 (2013.01); H01J 2237/2802 (2013.01);
Abstract
An electron microscope includes an acquisition section that acquires an electron microscope image of a specimen that includes a plurality of identical patterns, and a spectrum at each pixel of the electron microscope image, and an elemental map generation section that adds up the spectrum at each pixel of each of a plurality of areas that are included in the electron microscope image and have an identical size to generate an elemental mapping image of the specimen.