The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Mar. 04, 2015
Freescale Semiconductor, Inc., Austin, TX (US);
Jorge Corso, Austin, TX (US);
Marcos C. Barros, Santa Barbara d'Oeste, BR;
Alexandre S. Lujan, Campinas, BR;
NXP USA, INC., Austin, TX (US);
Abstract
A method for performing scan testing using a scan chain having a plurality of storage elements is described. During a capture phase, each storage element of the scan chain stores data from a first data input of the storage element synchronously to a clock signal. And during a shift phase, a scan pattern is shifted into the scan chain in which each storage element stores data from a second data input of the storage element asynchronously with to the clock signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile