The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Sep. 15, 2015
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventors:
Jae-Won Cha, Gyeonggi-do, KR;
Jae-Woo Park, Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G06F 11/1068 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 2029/0411 (2013.01);
Abstract
An error correction circuit includes: a failure detection unit suitable for detecting failed data among a plurality of data; a data output control unit suitable for selectively outputting test data corresponding to a predetermined amount of data excluding the failed data; and an error correction unit suitable for performing a unit ECC operation on the test data.
Quick Actions:
Cha, Jae-Won. (2017). Error correction circuit and semiconductor memory device including the same (U.S. Patent No. 9613717). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9613717
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