The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 2017
Filed:
Oct. 11, 2012
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Saeed Sharifi Tehrani, San Diego, CA (US);
Nicholas J. Richardson, San Diego, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); G06F 11/00 (2006.01); G06F 11/10 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1012 (2013.01); H03M 13/114 (2013.01); H03M 13/116 (2013.01); H03M 13/1108 (2013.01); H03M 13/1137 (2013.01);
Abstract
The present disclosure includes apparatuses and methods related to updating reliability data. A number of methods can include receiving, at a variable node, either a first reliability data value with a first hard data value or a second reliability data value with a second hard data value, sending the first hard data value or the second hard data value to each check node coupled to the variable node according to a parity check code, and updating the reliability data based on input from less than all of the check nodes.