The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Apr. 21, 2015
International Business Machines Corporation, Hopewell Junction, NY (US);
Adil Bhanji, Wappingers Falls, NY (US);
Kerim Kalafala, Rhinebeck, NY (US);
Ravichander Ledalla, Fishkill, NY (US);
Debjit Sinha, Wappingers Falls, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Michael H. Wood, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The timing analysis of an integrated chip component using dynamic load sensitive timing feedback constraints maintaining the timing accuracy for all the boundary paths is achieved by capturing a reduced order representation for parasitic load within a component for each of its primary input and primary output along with sensitivities of the arrival time, the slew and the required arrival time to the load representation at the component parent level of hierarchy as part of generating load sensitive feedback constraints. During the out-of-context timing closure of the component, the base load representation and the sensitivities, and an updated load representation enables the calculation of the updated boundary constraint for an accurate timing analysis. The accuracy improvement increases a chip designer productivity during timing closure resulting in a shortened time to take the chip design through timing closure to manufacturing. The method is applicable for deterministic as well as for statistical timing analyses.