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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9607123 B1

PDFFull Text
Date of Patent:
Mar. 28, 2017

Filed:

Jan. 16, 2015

Method for performing deep n-typed well-correlated (dnw-correlated) antenna rule check of integrated circuit and semiconductor structure complying with dnw-correlated antenna rule

Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Xing Hua Zhang, Singapore, SG;

Chi-Fa Ku, Kaohsiung, TW;

Hong Liao, Singapore, SG;

Ye Chao Li, Singapore, SG;

Hui Yang, Singapore, SG;

Assignee:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Attorneys:

Winston Hsu

Scott Margo

Primary Examiner:

Helen Rossoshek

Int. Cl.
CPC ...
G06F 17/50 (2006.01); H01L 23/58 (2006.01); H01L 21/66 (2006.01); H01L 23/528 (2006.01); H01L 21/8238 (2006.01); H01L 27/02 (2006.01); H01L 23/10 (2006.01); H01L 27/06 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); H01L 22/34 (2013.01); H01L 23/58 (2013.01); H01L 21/823871 (2013.01); H01L 23/10 (2013.01); H01L 23/528 (2013.01); H01L 23/562 (2013.01); H01L 27/0266 (2013.01); H01L 27/0629 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A semiconductor monitoring device includes a substrate, a die seal ring formed on the substrate, a deep n-typed well formed in the substrate under the die seal ring, and a monitoring device electrically connected to the die seal ring. The monitoring device is formed in a scribe line region defined on the substrate. A width of the deep n-typed well is larger than a width of the die seal ring.

Find Patent Forward Citations

Quick Actions:

Zhang, Xing. (2017). Method for performing deep n-typed well-correlated (dnw-correlated) antenna rule check of integrated circuit and semiconductor structure complying with dnw-correlated antenna rule (U.S. Patent No. 9607123). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9607123

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