The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Dec. 30, 2011
Ankush Varma, Hillsboro, OR (US);
Jeremy J. Shrall, Portland, OR (US);
Krishnakanth Venkata Sistla, Beaverton, OR (US);
Avinash N. Ananthakrishnan, Hillsboro, OR (US);
Vivek Garg, Folsom, CA (US);
Christopher A. Poirier, Sr., Fort Collins, CO (US);
Martin T. Rowland, Beaverton, OR (US);
Edward R. Stanford, DuPont, WA (US);
Ankush Varma, Hillsboro, OR (US);
Jeremy J. Shrall, Portland, OR (US);
Krishnakanth Venkata Sistla, Beaverton, OR (US);
Avinash N. Ananthakrishnan, Hillsboro, OR (US);
Vivek Garg, Folsom, CA (US);
Christopher A. Poirier, Sr., Fort Collins, CO (US);
Martin T. Rowland, Beaverton, OR (US);
Edward R. Stanford, DuPont, WA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Dynamic runtime calibration of a processor with respect to a specific voltage regulator that powers the processor or a memory subsystem coupled to the processor can reduce or eliminate the need for guardbands in power management computations. The processor receives a current measurement from the voltage regulator and computes a calibration factor based on the measured value and a stored expected value. The calibration factor can be used in making power management decisions instead of adding the guardband to power readings. A manufacturer or distributor of the processor can compute the stored values with a controlled voltage supply that has a higher precision than typical commercial power supplies used in computing systems. The computed, stored values indicate the expected value, which can be used to determine a calibration factor relative to a voltage regulator of an active system.