The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Aug. 29, 2014
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Tsuyoshi Yamashita, Gunma, JP;

Mitsunori Aizawa, Saitama, JP;

Hiromitsu Horino, Saitama, JP;

Yuya Yamada, Gunma, JP;

Masataka Onozawa, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01C 11/00 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01C 11/00 (2013.01); G01R 1/0441 (2013.01); G01R 31/2893 (2013.01);
Abstract

Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.


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