The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2017
Filed:
Nov. 16, 2012
Applicant:
President and Fellows of Harvard College, Cambridge, MA (US);
Inventors:
Ramaswamy Krishnan, Cambridge, MA (US);
Allen Ehrlicher, Boston, MA (US);
James Butler, Brookline, MA (US);
David A. Weitz, Bolton, MA (US);
Jeffrey J. Fredberg, Sharon, MA (US);
Chan Young Park, Belmont, MA (US);
Assignee:
President and Fellows of Harvard College, Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01); C12M 1/00 (2006.01); C12M 1/12 (2006.01); B05D 3/00 (2006.01); B32B 37/24 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5029 (2013.01); B05D 3/007 (2013.01); B32B 37/24 (2013.01); C12M 23/20 (2013.01); C12M 25/14 (2013.01); G01N 33/4833 (2013.01); B32B 2037/243 (2013.01); G01N 2500/10 (2013.01); Y10T 156/10 (2015.01);
Abstract
A platform for biological assays includes a base substrate providing structural support to the platform, at least one surface of the base substrate coated with position markers, a first deformable layer positioned on top of the base substrate, and a second deformable layer positioned on top of the first deformable layer, the second deformable layer embedded with deformation markers.