The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Jul. 05, 2013
Applicant:

Moba Group B.v., Barneveld, NL;

Inventors:

Edwin Van Wegen, Barneveld, NL;

Josse De Baerdemaeker, Leuven, BE;

Bart Kemps, Leuven, BE;

Jeroen Evert Jan Brunnenkreef, Barneveld, NL;

Bart De Ketelaere, Leuven, BE;

Assignee:

MOBA GROUP B.V., Barneveld, NL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/08 (2006.01); A01K 43/00 (2006.01); G01N 21/95 (2006.01); G01N 21/13 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 33/08 (2013.01); A01K 43/00 (2013.01); G01N 21/13 (2013.01); G01N 21/55 (2013.01); G01N 21/95 (2013.01); G01N 2201/0438 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

This invention relates to a method and an apparatus for characterizing eggshells of eggs, the eggs being supported, comprising: —deforming the eggshell, —scanning the eggshell with a laser beam of a Self Mixing Laser Vibrometer (SMLV) with scanning signals, whereby a reflection light signal of reflection light is obtained, —processing scanning signal and the reflection signal with the SMLV, whereby a mixed signal with crack information is obtained, —during scanning moving the eggs relative to the SMLV, —comparing the signals with preset criteria and characteristics of such eggs, whereby comparative data are obtained, and —characterizing the eggshells on the basis of the comparative data.


Find Patent Forward Citations

Van Wegen, Edwin. (2017). Method and apparatus for detecting cracks in eggshells (U.S. Patent No. 9606096). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9606096

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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