The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Sep. 30, 2013
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Edward E. King, Dayton, OH (US);

David A. Heaps, Yardley, PA (US);

Gregory Scott Self, El Dorado Hills, CA (US);

Richard R. McKay, East Windsor, NJ (US);

Mark J. Sullivan, Framingham, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3586 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01);
Abstract

A holder and apparatus for terahertz imaging and/or spectroscopy of beads, particles or microparticles, and methods for terahertz imaging and/or spectroscopy of beads, particles or microparticles and making the holder are disclosed. The holder includes a tray having a substantially planar upper surface, and one or more offsets above or below the substantially planar upper surface. Each offset is configured to hold one of the beads, particles or microparticles, and has a height or depth configured to minimize or eliminate interference between reflections of the terahertz radiation from the tray and reflections of the terahertz radiation from the bead, particle or microparticle in or on the offset.


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