The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2017

Filed:

Apr. 04, 2012
Applicants:

Qingchun Zhang, Cary, NC (US);

Anant K. Agarwal, Chapel Hill, NC (US);

Lin Cheng, Chapel Hill, NC (US);

Inventors:

Qingchun Zhang, Cary, NC (US);

Anant K. Agarwal, Chapel Hill, NC (US);

Lin Cheng, Chapel Hill, NC (US);

Assignee:

Cree, Inc., Durham, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/73 (2006.01); H01L 29/06 (2006.01); H01L 29/74 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7302 (2013.01); H01L 29/0626 (2013.01); H01L 29/1608 (2013.01); H01L 29/7424 (2013.01);
Abstract

A bipolar junction transistor (BJT), which includes a collector layer, a base layer on the collector layer, an emitter layer on the base layer, and a recess region embedded in the collector layer, is disclosed. A base-collector plane is between the base layer and the collector layer. The recess region is may be below the base-collector plane. Further, the recess region and the base layer are a first type of semiconductor material. By embedding the recess region in the collector layer, the recess region and the collector layer form a first P-N junction, which may provide a point of avalanche for the BJT. Further, the collector layer and the base layer form a second P-N junction. By separating the point of avalanche from the second P-N junction, the BJT may avalanche robustly, thereby reducing the likelihood of avalanche induced failures, particularly in silicon carbide (SiC) BJTs.


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