The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2017
Filed:
Mar. 06, 2014
Andrew Richard Portune, Oakdale, PA (US);
Walter John Keller, Iii, Bridgeville, PA (US);
Andrew Richard Portune, Oakdale, PA (US);
Walter John Keller, III, Bridgeville, PA (US);
Nokomis, Inc., Charleroi, PA (US);
Abstract
A system for determining properties and structural integrity of a material comprises a probe including a housing, a source operable to propagate an acoustic energy through a thickness of the material, a source operable to propagate a radio frequency (RF) energy through the thickness of the material, an acoustic member mounted within the housing and operable to measure a response of the material to the acoustic energy, and a radio frequency (RF) member mounted within the hollow interior in a close proximity to the acoustic member and operable to measure a response of the material to the RF energy. A hardware interface device is coupled to both acoustic and RF members. A controller is coupled to the hardware interface and configured to receive the acoustic and RF response signals and includes a processor operable to process the received acoustic and RF response signals.