The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

May. 27, 2016
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Wing Fai Loke, San Jose, CA (US);

Chih-Wei Yao, Sunnyvale, CA (US);

Sunghwan Kim, Los Gatos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/12 (2006.01);
U.S. Cl.
CPC ...
H03B 5/124 (2013.01); H03B 5/1212 (2013.01); H03B 5/1215 (2013.01); H03B 5/1225 (2013.01); H03B 5/1243 (2013.01); H03J 2200/10 (2013.01);
Abstract

Methods, apparatuses, and systems for providing a variable output using an array of cells are discussed. In the fine tuning bank of an apparatus, control is implemented by selecting a boundary cell from the array of cells and having every cell before the boundary cell in a circuit path be grounded and having the boundary cell and every cell after the boundary cell in the circuit path be connected to a voltage source. The circuit path may be the one formed by using thermometer coding in the fine tuning bank.


Find Patent Forward Citations

Loke, Wing. (2017). Fine tuning control apparatus and method (U.S. Patent No. 9595915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9595915

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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