The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Dec. 19, 2013
Applicants:

Himyanshu Anand, Cedar Park, TX (US);

Magdy S. Abadir, Austin, TX (US);

Inventors:

Himyanshu Anand, Cedar Park, TX (US);

Magdy S. Abadir, Austin, TX (US);

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5036 (2013.01);
Abstract

An approach is provided in which a hybrid mixed signal equivalence checking system partitions a mixed signal reference model and a mixed signal model under verification into analog sections and digital sections. The hybrid mixed signal equivalence checking system simulates the analog sections from the two different models to determine analog equivalence. As such, the hybrid mixed signal equivalence checking system verifies digital equivalence between the digital reference section and the digital section model under verification in response to evaluating one or more difference functions that represent at least a portion of the first digital section and the second digital section. As a result, the hybrid mixed signal equivalence checking system verifies equivalence between the mixed signal reference model and the mixed signal model under verification based upon the verified analog equivalence and the verified digital equivalence.


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