The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Sep. 26, 2012
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in X columns and Y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/K, where KεN, the size of the scanning field being varied by varying K. After scanning K lines, a vertical skip is made, e.g. a skip of (n−1)×K+1 lines in the scanning direction or (n+1)×K−1 lines against the scanning direction until at least Y lines have been scanned.