The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2017

Filed:

Jun. 30, 2011
Applicants:

Markus Schlosser, Hannover, DE;

Jorn Jachalsky, Wennigsen, DE;

Ralf Ostermann, Hannover, DE;

Inventors:

Markus Schlosser, Hannover, DE;

Jorn Jachalsky, Wennigsen, DE;

Ralf Ostermann, Hannover, DE;

Assignee:

THOMSON LICENSING, Issy les Moulineaux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06K 7/00 (2006.01); H04N 13/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0022 (2013.01); G06K 9/4642 (2013.01); G06T 7/0075 (2013.01); H04N 13/004 (2013.01); H04N 13/007 (2013.01); G06T 2207/10021 (2013.01);
Abstract

The invention relates to a method and an apparatus for determining a disparity value for an object located in or to be placed into a stereoscopic image pair having an associated disparity map. First an area to be analyzed in one of the stereoscopic images is determined Then a histogram is built from disparity estimates of the associated disparity map that fall within the determined area. Subsequently a contiguous range of bins is searched in the histogram that also contains a sufficient number of pixels. Finally, a disparity estimate for the determined area is selected from the contiguous range of histogram bins.


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