The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Apr. 22, 2016
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Liang Pang, Fremont, CA (US);

Yingda Dong, San Jose, CA (US);

Jiahui Yuan, Fremont, CA (US);

Jingjian Ren, San Jose, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/00 (2006.01); G11C 16/10 (2006.01); G11C 16/04 (2006.01); G11C 16/28 (2006.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 16/0483 (2013.01); G11C 16/28 (2013.01);
Abstract

Techniques are provided for avoiding over-programming which can occur on memory cells connected to a data word line at a source-side of a block of word lines. A gradient in the channel potential is created during a program voltage between the data word line and an adjacent dummy word line. This gradient generates electron-hole pairs which can contribute to over programming, where the over programming is worse at higher temperatures. In one aspect, pass voltages of unselected word lines are set to be relatively lower when the temperature is relatively higher, and when the selected word line is among a set of one or more source-side word lines. On the other hand, the pass voltages are set to be relatively higher when the temperature is relatively higher, and when the selected word line is not among the one or more source-side word lines.


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