The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2017

Filed:

Dec. 16, 2014
Applicant:

Screen Semiconductor Solutions Co., Ltd., Kyoto, JP;

Inventors:

Masahiko Harumoto, Kyoto, JP;

Akira Yamaguchi, Kyoto, JP;

Akihiro Hisai, Kyoto, JP;

Minoru Sugiyama, Kyoto, JP;

Takuya Kuroda, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/12 (2006.01); G03F 7/30 (2006.01); G03F 7/20 (2006.01); H01L 21/67 (2006.01); B05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/30 (2013.01); G03F 7/2041 (2013.01); G03F 7/3021 (2013.01); B05D 1/005 (2013.01); H01L 21/6715 (2013.01);
Abstract

A method for developing a substrate includes spinning the substrate with a spin holder and discharging a developer to the substrate from a plurality of exhaust ports arranged in a row on a developer feeder. The method also includes causing a moving mechanism to move said developer feeder in one direction extending to a center of the substrate in plan view while maintaining a direction of arrangement of said exhaust ports in said one direction, thereby to move said developer feeder between substantially the center and an edge of the substrate. The method further includes causing the developer discharged from said exhaust ports to impinge in separate streams on the substrate, and causing each of the separate streams to impinge spirally on the substrate, thereby to develop the substrate. At least two of loci of positions of impingement of the developer corresponding to said exhaust ports overlap each other.


Find Patent Forward Citations

Loading…