The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2017
Filed:
Aug. 04, 2015
Applicant:
Oxford Instruments Asylum Research, Inc., Goleta, CA (US);
Inventors:
Mario Viani, Santa Barbara, CA (US);
Roger Proksch, Santa Barbara, CA (US);
Maarten Rutgers, Los Angeles, CA (US);
Jason Cleveland, Ventura, CA (US);
Jim Hodgson, Santa Barbara, CA (US);
Assignee:
Oxford Instruments Asylum Research, Inc, Goleta, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/20 (2010.01); G01Q 30/18 (2010.01); G01Q 10/00 (2010.01); G01Q 30/10 (2010.01); G01Q 30/12 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/20 (2013.01); G01Q 10/00 (2013.01); G01Q 30/18 (2013.01); G01Q 30/10 (2013.01); G01Q 30/12 (2013.01);
Abstract
A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.