The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Jan. 27, 2016
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Masanori Itou, Kumamoto, JP;

Ryoichi Sakamoto, Kumamoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 38/10 (2006.01); H01L 21/78 (2006.01); H01L 21/67 (2006.01); H01L 21/66 (2006.01); B32B 43/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/78 (2013.01); H01L 21/67092 (2013.01); H01L 21/67253 (2013.01); H01L 22/12 (2013.01); B32B 38/10 (2013.01); B32B 43/006 (2013.01); Y10T 156/1179 (2015.01); Y10T 156/1184 (2015.01); Y10T 156/1961 (2015.01); Y10T 156/1967 (2015.01);
Abstract

Provided is a peeling apparatus configured to suppress damage to a substrate, by forming a peeling start point. The peeling apparatus separates a superimposed substrate made by joining first and second substrates into the first and second substrates, and includes a blade configured to form a notch as a peeling start point between the first and second substrates, and an inspection unit configured to inspect a state of a cutting edge of the blade. The inspection unit includes an imaging unit configured to image the cutting edge of the blade, and an image processing unit configured to process an image of the imaging unit.


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