The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2017

Filed:

Jan. 23, 2015
Applicant:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Inventors:

Pradeep Lenka, Milpitas, CA (US);

Kyoho Lee, Pleasanton, CA (US);

Andrew Lin, San Jose, CA (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318516 (2013.01);
Abstract

Various techniques are provided to implement user specified test registers locally on a PLD for use while the PLD is configured with a user design and tested. In one example, a machine-implemented method includes receiving, from an external test application, a data value at a programmable logic device (PLD) running configured user logic. The method also includes writing the data value into a test register of the PLD. The method also includes providing a control signal from the test register to the configured user logic in response to the data value. The method also includes switching operation of the configured user logic from a first test implementation to a second test implementation in response to the control signal.


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